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authorGabriel F. T. Gomes <gabrielftg@linux.ibm.com>2019-07-11 11:47:39 -0300
committerGabriel F. T. Gomes <gabrielftg@linux.ibm.com>2019-11-27 15:52:41 -0300
commitff3cb5accb80471df69fac2c0dded9cab794220a (patch)
treea1651f0ccbdf68d3f0f6969654ed2e98d27e525a /sysdeps/ieee754/ldbl-128ibm-compat/test-obstack-ieee128.c
parent9f25935dda6973292e989302752d11e720e23c0c (diff)
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ldbl-128ibm-compat: Reuse tests for err.h and error.h functions
Commit IDs 9771e6cb5102 and 7597b0c7f711 added tests for the functions
from err.h and error.h that can take long double parameters.
Afterwards, commit ID f0eaf8627654 reused them on architectures that
changed the long double format from the same as double to something else
(i.e.: architectures that imply ldbl-opt).  This patch reuses it again
for IEEE long double on powerpc64le.

Tested for powerpc64le.

Reviewed-by: Paul E. Murphy <murphyp@linux.ibm.com>
Diffstat (limited to 'sysdeps/ieee754/ldbl-128ibm-compat/test-obstack-ieee128.c')
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