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authorPeter Stephenson <p.stephenson@samsung.com>2018-04-25 18:15:21 +0100
committerPeter Stephenson <p.stephenson@samsung.com>2018-04-25 18:16:02 +0100
commitbdd595321fc3e95e8e60319d130b287bedc33d26 (patch)
tree0776efe3d57d95fedee6a6b2c0eacee0c5136d36 /ChangeLog
parent76b5b3a504f5a2d9062a82dec279c3d88d57e8ee (diff)
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42722: Replace ed with dc in fg/bg tests.
This should be even simpler.

Also more fix ups for failed pattern diffs.
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 2018-04-25  Peter Stephenson  <p.stephenson@samsung.com>
 
+	* 42722: Test/ztst.zsh, Test/W02jobs.ztst: replace ed with
+	dc and hope for better times.
+
 	* 42714: Test/W02jobs.ztst, Test/ztst.zsh: add basic fg and bg
 	tests using ed.  Improve output on pattern difference failure in
 	tests.